CFP summary
ITC 2026 is the International Test Conference, a major venue for electronic test, reliability, and validation technologies across the lifecycle of integrated circuits and systems. The conference addresses the technical and practical challenges of testing increasingly complex hardware, from design-for-test and manufacturing test through diagnosis, security, and in-field dependability. Its program traditionally connects academic advances with industrial practice in semiconductor test and quality assurance.
Topics
Design-for-test; manufacturing test; diagnosis and yield learning; reliability and aging; silicon debug; test compression and BIST; hardware security and trust; memory test and repair; validation and post-silicon verification; automotive, safety-critical and system-level test.