IEEE 35th Asian Test Symposium 2026

ATS 2026 is the 35th IEEE Asian Test Symposium, a long-running international forum focused on the theory, techniques, tools, and industrial practice of electronic testing, reliability, and design-for-test. The conference brings together researchers and practitioners working on test generation, diagnosis, validation, yield and reliability enhancement, and emerging challenges in modern integrated circuits and systems. The 2026 edition is hosted in Kaohsiung, Taiwan and continues the series' role as a meeting point for academic research, EDA development, and semiconductor industry applications.

Topics highlighted on the conference site include analog and mixed-signal test; memory test and repair; ATPG, BIST, compression, DFT and testability; diagnosis, debug, silicon learning and failure analysis; burn-in, reliability, aging and variation-aware test; test for AI accelerators, automotive systems, chiplets, 3D ICs, NoCs and heterogeneous integration; security, trust and hardware Trojan detection; validation, fault modeling, power-aware test, on-line test, and data-driven or machine-learning-assisted test methods.